𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - Benchmark methodology of interconnect capacitance simulation using inter-digitated capacitors

✍ Scribed by Nakagawa, O.S.; Oh, S.-Y.; Hsu, T.; Habu, S.

Book ID: 118256897
Publisher: IEEE
Year: 1998
Weight: 267 KB
Volume: 0
Category: Article
ISBN-13: 9780780343481
DOI: 10.1109/icmts.1998.688103

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE ICMTS 1998. International Conferen

[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - Direct extraction of SPICE Gummel-Poon parameters for high frequency modeling

✍ Breti, J.W.; Kendall, J.D.; Nathawad, L. 📂 Article 📅 1998 🏛 IEEE ⚖ 571 KB

[IEEE ICMTS 1998. International Conferen

[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - Anomalous geometry dependence of source/drain resistance in narrow-width MOSFETs

✍ Scholten, A.J.; Klaassen, D.B.M. 📂 Article 📅 1998 🏛 IEEE ⚖ 503 KB

[IEEE ICMTS 1998. International Conferen

[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - A new direct extraction algorithm for intrinsic Gummel-Poon BJT model parameters

✍ Ingvarson, F.; Jeppson, K.O. 📂 Article 📅 1998 🏛 IEEE ⚖ 663 KB

[IEEE ICMTS 2001. Proceedings of the 200

[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - Evaluation of high-performance SOI complementary BiCMOS devices by using test structures

✍ Tamaki, Y.; Iwasaki, T.; Tsuji, K.; Chida, Y.; Tomatsuri, T.; Yoshida, E.; Kumaz 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 397 KB

[IEEE ICMTS 2001. Proceedings of the 200

[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - Resistor matching characterization for process development using D/A converter

✍ Katakam, S.; Tranchina, B.; Bordelon, J.; Ramaswamy, A.; Wooyoung Choi, ; Chu, S 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 402 KB

[IEEE ICMTS 2001. Proceedings of the 200

[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - Statistical SPICE analysis of a 0.18 μm CMOS digital/analog technology during process development

✍ Rankin, N.S.; Chun Ng, ; Leang Sern Ee, ; Boyland, F.; Quek, E.; Leung Ying Keun 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 488 KB