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[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - A new direct extraction algorithm for intrinsic Gummel-Poon BJT model parameters

✍ Scribed by Ingvarson, F.; Jeppson, K.O.

Book ID: 118172856
Publisher: IEEE
Year: 1998
Weight: 663 KB
Volume: 0
Category: Article
ISBN-13: 9780780343481
DOI: 10.1109/icmts.1998.688061

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