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[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - Direct extraction of SPICE Gummel-Poon parameters for high frequency modeling

✍ Scribed by Breti, J.W.; Kendall, J.D.; Nathawad, L.

Book ID: 115521419
Publisher: IEEE
Year: 1998
Weight: 571 KB
Volume: 0
Category: Article
ISBN-13: 9780780343481
DOI: 10.1109/icmts.1998.688047

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