𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - Anomalous geometry dependence of source/drain resistance in narrow-width MOSFETs

✍ Scribed by Scholten, A.J.; Klaassen, D.B.M.

Book ID: 118208568
Publisher: IEEE
Year: 1998
Weight: 503 KB
Volume: 0
Category: Article
ISBN-13: 9780780343481
DOI: 10.1109/icmts.1998.688046

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE ICMTS 1998. International Conferen

[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - Benchmark methodology of interconnect capacitance simulation using inter-digitated capacitors

✍ Nakagawa, O.S.; Oh, S.-Y.; Hsu, T.; Habu, S. 📂 Article 📅 1998 🏛 IEEE ⚖ 267 KB

[IEEE ICMTS 1998. International Conferen

[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - Direct extraction of SPICE Gummel-Poon parameters for high frequency modeling

✍ Breti, J.W.; Kendall, J.D.; Nathawad, L. 📂 Article 📅 1998 🏛 IEEE ⚖ 571 KB

[IEEE ICMTS 1998. International Conferen

[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - A new direct extraction algorithm for intrinsic Gummel-Poon BJT model parameters

✍ Ingvarson, F.; Jeppson, K.O. 📂 Article 📅 1998 🏛 IEEE ⚖ 663 KB

[IEEE International Conference on Microe

[IEEE International Conference on Microelectronic Test Structures - Goteborg, Sweden (15-18 March 1999)] ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) - Geometry modeling method for narrow/short and narrow MOSFETs

✍ Sekine, S.; Sugiyama, M.; Saito, N. 📂 Article 📅 1999 🏛 IEEE 🌐 English ⚖ 521 KB