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[IEEE International Conference on Microelectronic Test Structures - Goteborg, Sweden (15-18 March 1999)] ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) - Geometry modeling method for narrow/short and narrow MOSFETs

✍ Scribed by Sekine, S.; Sugiyama, M.; Saito, N.

Book ID: 118208569
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 521 KB
Volume: 0
Category: Article
ISBN-13: 9780780352704
DOI: 10.1109/icmts.1999.766229

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