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[IEEE ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures - Monterey, CA, USA (13-16 March 2000)] ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) - Physically-based effective width modeling of MOSFETs and diffused resistors

✍ Scribed by McAndrew, C.C.; Sekine, S.; Cassagnes, A.; Zhicheng Wu,

Book ID: 118208570
Publisher: IEEE
Year: 2000
Weight: 383 KB
Volume: 0
Category: Article
DOI: 10.1109/icmts.2000.844426

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