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[IEEE ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures - Monterey, CA, USA (13-16 March 2000)] ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) - A novel approach for precise characterization of long distance mismatch of CMOS-devices

✍ Scribed by Schaper, U.; Linnenbank, C.; Thewes, R.

Book ID: 118166231
Publisher: IEEE
Year: 2000
Weight: 270 KB
Volume: 0
Category: Article
DOI: 10.1109/icmts.2000.844422

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