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[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - Mis-match characterization of 1.8 V and 3.3 V devices in 0.18 μm mixed signal CMOS technology

✍ Scribed by Ta-Hsun Yeh, ; Lin, J.C.H.; Shyh-Chyi Wong, ; Huang, H.; Sun, J.Y.C.

Book ID: 118172146
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 461 KB
Volume: 0
Category: Article
ISBN-13: 9780780365117
DOI: 10.1109/icmts.2001.928641

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