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[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - Statistical SPICE analysis of a 0.18 μm CMOS digital/analog technology during process development

✍ Scribed by Rankin, N.S.; Chun Ng, ; Leang Sern Ee, ; Boyland, F.; Quek, E.; Leung Ying Keung, ; Walton, A.J.; Redford, M.

Book ID: 115496441
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 488 KB
Volume: 0
Category: Article
ISBN-13: 9780780365117
DOI: 10.1109/icmts.2001.928631

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