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[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - Efficient parameter extraction techniques for a new surface-potential-based MOS model for RF applications

✍ Scribed by Wenzhi Liang, ; Van Langevelde, R.; McCarthy, K.G.; Mathewson, A.

Book ID: 118172147
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 402 KB
Volume: 0
Category: Article
ISBN-13: 9780780365117
DOI: 10.1109/icmts.2001.928652

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