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[IEEE 31st European Solid-State Device Research Conference - Nuremberg, Germany (2001.9.11-2001.9.13)] 31st European Solid-State Device Research Conference - The Impact of High-K Gate Dielectrics on Sub 100 nm CMOS Circuit Performance

✍ Scribed by Mohapatra, N.R.; Desai, M.P.; Narendra, S.G.; V. Ramgopal Rao,

No coin nor oath required. For personal study only.

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