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[IEEE 31st European Solid-State Device Research Conference - Nuremberg, Germany (2001.9.11-2001.9.13)] 31st European Solid-State Device Research Conference - Impact of Channel Engineering Technology on HC Performance of 100 nm MOSFETs

✍ Scribed by Okhonin, S.; Fazan, P.; Kubicek, S.; Henson, K.; De Meyer, K.; Ponomarev, Y.V.

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