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[IEEE Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004. - San Jose, CA, USA (2004.08.10-2004.08.10)] Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004. - The state-of-art and future trends in testing embedded memories

✍ Scribed by Hamdioui, S.; Gaydadjiev, G.; van de Goor, A.J.

Book ID: 120168927
Publisher: IEEE
Year: 2004
Weight: 314 KB
Category: Article
ISBN-13: 9780769521930
DOI: 10.1109/MTDT.2004.1327984

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