[IEEE Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004. - San Jose, CA, USA (2004.08.10-2004.08.10)] Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004. - Do we need anything more than single bit error correction (ECC)?

✍ Scribed by Spica, M.; Mak, T.M.

• Book ID: 118229963
• Publisher: IEEE
• Year: 2004
• Weight: 240 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780769521930
• DOI: 10.1109/mtdt.2004.1327993