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[IEEE Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004. - San Jose, CA, USA (2004.08.10-2004.08.10)] Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004. - Fast error-correcting circuits for fault-tolerant memory

✍ Scribed by Ou, E.; Yang, W.

Book ID: 115533560
Publisher: IEEE
Year: 2004
Weight: 290 KB
Volume: 0
Category: Article
ISBN-13: 9780769521930
DOI: 10.1109/mtdt.2004.1327977

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