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[IEEE Comput. Soc. Press IEEE International Workshop on Memory Technology, Design, and Test - San Jose, CA, USA (8-9 Aug. 1994)] Proceedings of IEEE International Workshop on Memory Technology, Design, and Test - GOS defects in SRAM: fault modeling and testing possibilities

✍ Scribed by Segura, J.A.; Rubio, A.

Book ID: 118002411
Publisher: IEEE Comput. Soc. Press
Year: 1994
Weight: 444 KB
Volume: 0
Category: Article
ISBN-13: 9780818662454
DOI: 10.1109/mtdt.1994.397195

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