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[IEEE Comput. Soc ISQED 2003: 4th International Symposium on Quality Electronic Design - San Jose, CA, USA (24-26 March 2003)] Fourth International Symposium on Quality Electronic Design, 2003. Proceedings. - Design and use of memory-specific test structures to ensure SRAM yield and manufacturability

✍ Scribed by Duan, F.; Castagnetti, R.; Venkatraman, R.; Kobozeva, O.; Ramesh, S.

Book ID: 118117753
Publisher: IEEE Comput. Soc
Year: 2003
Tongue: English
Weight: 698 KB
Volume: 0
Category: Article
ISBN-13: 9780769518817
DOI: 10.1109/isqed.2003.1194719

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