[IEEE Comput. Soc 5th International Symposium on Quality Electronic Design - San Jose, CA, USA (22-24 March 2004)] SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720) - The effect of threshold voltages on the soft error rate [memory and logic circuits]

✍ Scribed by Degalahal, V.; Ramanarayanan, R.; Vijaykrishnan, N.; Xie, Y.; Irwin, M.J.

• Book ID: 118028994
• Publisher: IEEE Comput. Soc
• Year: 2004
• Tongue: English
• Weight: 303 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780769520933
• DOI: 10.1109/isqed.2004.1283723