[IEEE Comput. Soc. Press IEEE International Workshop on Memory Technology, Design, and Test - San Jose, CA, USA (8-9 Aug. 1994)] Proceedings of IEEE International Workshop on Memory Technology, Design, and Test - Built-in random testing for dual-port RAMs

[IEEE Comput. Soc. Press IEEE Internatio

[IEEE Comput. Soc. Press IEEE International Workshop on Memory Technology, Design, and Test - San Jose, CA, USA (8-9 Aug. 1994)] Proceedings of IEEE International Workshop on Memory Technology, Design, and Test - GOS defects in SRAM: fault modeling and testing possibilities

✍ Segura, J.A.; Rubio, A. 📂 Article 📅 1994 🏛 IEEE Comput. Soc. Press ⚖ 444 KB

[IEEE Comput. Soc 2001 IEEE Internationa

[IEEE Comput. Soc 2001 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (6-7 Aug. 2001)] Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing - A parallel approach for testing multi-port static random access memories

✍ Karimi, F.; Irrinki, S.; Crosbuy, T.; Lombardi, F. 📂 Article 📅 2001 🏛 IEEE Comput. Soc 🌐 English ⚖ 680 KB

The 14 papers in this collection from the August 2001 workshop are divided into five sessions on semiconductor memory design, BIST, redundancy and error control, fault models and multi-port SRAM testing, and verification and testing. Some of the topics are evaluation of redundancy analysis algorithm

[IEEE Comput. Soc 2001 IEEE Internationa

[IEEE Comput. Soc 2001 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (6-7 Aug. 2001)] Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing - Realistic fault models and test procedure for multi-port SRAMs

✍ Hamdioui, S.; van de Goor, A.J.; Eastwick, D.; Rodgers, M. 📂 Article 📅 2001 🏛 IEEE Comput. Soc 🌐 English ⚖ 745 KB

The 14 papers in this collection from the August 2001 workshop are divided into five sessions on semiconductor memory design, BIST, redundancy and error control, fault models and multi-port SRAM testing, and verification and testing. Some of the topics are evaluation of redundancy analysis algorithm

[IEEE Comput. Soc 2001 IEEE Internationa

[IEEE Comput. Soc 2001 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (6-7 Aug. 2001)] Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing - Low output resistance charge pump for flash memory programming

✍ Khouri, S.; Gregori, S.; Micheloni, R.; Soltesz, D.; Torelli, G. 📂 Article 📅 2001 🏛 IEEE Comput. Soc 🌐 English ⚖ 436 KB

The 14 papers in this collection from the August 2001 workshop are divided into five sessions on semiconductor memory design, BIST, redundancy and error control, fault models and multi-port SRAM testing, and verification and testing. Some of the topics are evaluation of redundancy analysis algorithm

[IEEE Comput. Soc. Press Records of the

[IEEE Comput. Soc. Press Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (7-8 Aug. 1995)] Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing - An efficient test method for embedded multi-port RAM with BIST circuitry

✍ Matsumura, T. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press 🌐 English ⚖ 511 KB

[IEEE Comput. Soc International Workshop

[IEEE Comput. Soc International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (24-25 Aug. 1998)] Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. No.98TB100236) - Integration of non-classical faults in standard March tests

✍ Niggemeyer, D.; Redeker, M.; Otterstedt, J. 📂 Article 📅 1998 🏛 IEEE Comput. Soc ⚖ 42 KB