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[IEEE Comput. Soc. Press Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (7-8 Aug. 1995)] Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing - An efficient test method for embedded multi-port RAM with BIST circuitry

✍ Scribed by Matsumura, T.

Book ID: 121182726
Publisher: IEEE Comput. Soc. Press
Year: 1995
Tongue: English
Weight: 511 KB
Category: Article
ISBN-13: 9780818671029
DOI: 10.1109/MTDT.1995.518083

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