𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Comput. Soc. Press Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (7-8 Aug. 1995)] Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing - Optimization of memory organization and hierarchy for decreased size and power in video and image processing systems

✍ Scribed by Nachtergaele, L.; Catthoor, F.; Balasa, F.; Franssen, F.; De Greef, E.; Samsom, H.; De Man, H.

Book ID: 121323791
Publisher: IEEE Comput. Soc. Press
Year: 1995
Tongue: English
Weight: 615 KB
Category: Article
ISBN-13: 9780818671029
DOI: 10.1109/MTDT.1995.518086

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Comput. Soc. Press Records of the

[IEEE Comput. Soc. Press Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (7-8 Aug. 1995)] Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing - Modeling application specific memories

✍ Das, D.V.; Kumar, R.; Lauria, M. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press ⚖ 327 KB

[IEEE Comput. Soc. Press Records of the

[IEEE Comput. Soc. Press Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (7-8 Aug. 1995)] Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing - Performance in real-time main-memory databases

✍ Van Singel, S.; Tabe, T.; Soparkar, N.; Asthana, A. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press ⚖ 353 KB

[IEEE Comput. Soc. Press Records of the

[IEEE Comput. Soc. Press Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (7-8 Aug. 1995)] Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing - Automatic computation of test length for pseudo-random memory tests

✍ van de Goor, A.J. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press ⚖ 455 KB

[IEEE Comput. Soc. Press Records of the

[IEEE Comput. Soc. Press Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (7-8 Aug. 1995)] Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing - An efficient test method for embedded multi-port RAM with BIST circuitry

✍ Matsumura, T. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press 🌐 English ⚖ 511 KB

[IEEE Comput. Soc Record of the 2000 IEE

[IEEE Comput. Soc Record of the 2000 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (7-8 Aug. 2000)] Records of the IEEE International Workshop on Memory Technology, Design and Testing - Diagnostic testing of embedded memories based on output tracing

✍ Niggemeyer, D.; Redeker, M.; Rudnick, E.M. 📂 Article 📅 2000 🏛 IEEE Comput. Soc ⚖ 597 KB

[IEEE Comput. Soc Record of the 2000 IEE

[IEEE Comput. Soc Record of the 2000 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (7-8 Aug. 2000)] Records of the IEEE International Workshop on Memory Technology, Design and Testing - Windowed MRAM sensing scheme

✍ Zhang, R.; Black, W.C.; Hassoun, M.M. 📂 Article 📅 2000 🏛 IEEE Comput. Soc ⚖ 425 KB