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[IEEE Comput. Soc. Press Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (7-8 Aug. 1995)] Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing - Automatic computation of test length for pseudo-random memory tests

✍ Scribed by van de Goor, A.J.

Book ID: 126757531
Publisher: IEEE Comput. Soc. Press
Year: 1995
Weight: 455 KB
Category: Article
ISBN-13: 9780818671029
DOI: 10.1109/MTDT.1995.518082

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