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[IEEE Comput. Soc. Press Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (7-8 Aug. 1995)] Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing - Automatic computation of test length for pseudo-random memory tests

โœ Scribed by van de Goor, A.J.


Book ID
126757531
Publisher
IEEE Comput. Soc. Press
Year
1995
Weight
455 KB
Category
Article
ISBN-13
9780818671029

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