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[IEEE Comput. Soc Record of the 2000 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (7-8 Aug. 2000)] Records of the IEEE International Workshop on Memory Technology, Design and Testing - Diagnostic testing of embedded memories based on output tracing

✍ Scribed by Niggemeyer, D.; Redeker, M.; Rudnick, E.M.

Book ID: 126688468
Publisher: IEEE Comput. Soc
Year: 2000
Weight: 597 KB
Category: Article
ISBN-13: 9780769506890
DOI: 10.1109/MTDT.2000.868624

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