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[IEEE Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004. - San Jose, CA, USA (2004.08.10-2004.08.10)] Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004. - Markov models of fault-tolerant memory systems under SEU

✍ Scribed by Schiano, L.; Ottavi, M.; Lombardi, F.

Book ID: 121755780
Publisher: IEEE
Year: 2004
Weight: 343 KB
Category: Article
ISBN-13: 9780769521930
DOI: 10.1109/MTDT.2004.1327982

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