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[IEEE Proceedings of the IEEE 2004 International Interconnect Technology Conference - Burlingame, CA, USA (7-9 June 2004)] Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729) - General compact model for bit-rate limit of electrical interconnects considering DC resistance, skin effect and surface scattering

✍ Scribed by Sarvari, R.; Naeemi, A.; Meindl, J.D.

Book ID: 127083386
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 244 KB
Category: Article
ISBN-13: 9780780383081
DOI: 10.1109/iitc.2004.1345727

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