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[IEEE Proceedings of International Reliability Physics Symposium - Dallas, TX, USA (1996.04.30-1996.05.2)] Proceedings of International Reliability Physics Symposium RELPHY-96 - A new oxide degradation mechanism for stresses in the Fowler-Nordheim tunneling regime

✍ Scribed by Martin, A.; Suehle, J.S.; Chaparala, P.; O'Sullivan, P.; Mathewson, A.

Book ID: 126743391
Publisher: IEEE
Year: 1996
Weight: 949 KB
Category: Article
ISBN-13: 9780780327535
DOI: 10.1109/RELPHY.1996.492063

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