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[IEEE Proceedings of International Reliability Physics Symposium - Dallas, TX, USA (1996.04.30-1996.05.2)] Proceedings of International Reliability Physics Symposium RELPHY-96 - Investigation of charging damage induced V/sub t/ mismatch for submicron mixed-signal technology

✍ Scribed by Zhao, J.; Chen, H.S.; Teng, C.S.

Book ID: 126676853
Publisher: IEEE
Year: 1996
Weight: 417 KB
Category: Article
ISBN-13: 9780780327535
DOI: 10.1109/RELPHY.1996.492058

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