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[IEEE Proceedings of International Reliability Physics Symposium - Dallas, TX, USA (1996.04.30-1996.05.2)] Proceedings of International Reliability Physics Symposium RELPHY-96 - Non-uniform current flow through thin oxide after Fowler-Nordheim current stress

✍ Scribed by Yamada, S.; Amemiya, K.; Yamane, T.; Hazama, H.; Hashimoto, K.

Book ID: 120933335
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 485 KB
Edition: 1
Category: Article
ISBN-13: 9780780327535
DOI: 10.1109/RELPHY.1996.492068

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