𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Proceedings of International Reliability Physics Symposium - Dallas, TX, USA (1996.04.30-1996.05.2)] Proceedings of International Reliability Physics Symposium RELPHY-96 - Relation between yield and reliability of integrated circuits: experimental results and application to continuous early failure rate reduction programs

✍ Scribed by Kuper, F.; van der Pol, J.; Ooms, E.; Johnson, T.; Wijburg, R.; Koster, W.; Johnston, D.

Book ID: 126721010
Publisher: IEEE
Year: 1996
Weight: 447 KB
Category: Article
ISBN-13: 9780780327535
DOI: 10.1109/RELPHY.1996.492055

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Proceedings of International Relia

[IEEE Proceedings of International Reliability Physics Symposium - Dallas, TX, USA (1996.04.30-1996.05.2)] Proceedings of International Reliability Physics Symposium RELPHY-96 - Non-uniform current flow through thin oxide after Fowler-Nordheim current stress

✍ Yamada, S.; Amemiya, K.; Yamane, T.; Hazama, H.; Hashimoto, K. 📂 Article 📅 1996 🏛 IEEE 🌐 English ⚖ 485 KB

[IEEE Proceedings of International Relia

[IEEE Proceedings of International Reliability Physics Symposium - Dallas, TX, USA (1996.04.30-1996.05.2)] Proceedings of International Reliability Physics Symposium RELPHY-96 - Trapped hole enhanced stress induced leakage currents in NAND EEPROM tunnel oxides

✍ Hemink, G.J.; Shimizu, K.; Aritome, S.; Shirota, R. 📂 Article 📅 1996 🏛 IEEE ⚖ 633 KB

[IEEE Proceedings of International Relia

[IEEE Proceedings of International Reliability Physics Symposium - Dallas, TX, USA (1996.04.30-1996.05.2)] Proceedings of International Reliability Physics Symposium RELPHY-96 - A new oxide degradation mechanism for stresses in the Fowler-Nordheim tunneling regime

✍ Martin, A.; Suehle, J.S.; Chaparala, P.; O'Sullivan, P.; Mathewson, A. 📂 Article 📅 1996 🏛 IEEE ⚖ 949 KB

[IEEE Proceedings of International Relia

[IEEE Proceedings of International Reliability Physics Symposium - Dallas, TX, USA (1996.04.30-1996.05.2)] Proceedings of International Reliability Physics Symposium RELPHY-96 - Electric field dependent dielectric breakdown of intrinsic SiO/sub 2/ films under dynamic stress

✍ Chaparala, P.; Suehle, J.S.; Messick, C.; Roush, M. 📂 Article 📅 1996 🏛 IEEE ⚖ 590 KB

[IEEE Proceedings of International Relia

[IEEE Proceedings of International Reliability Physics Symposium - Dallas, TX, USA (1996.04.30-1996.05.2)] Proceedings of International Reliability Physics Symposium RELPHY-96 - Ultra thin oxide reliability: effects of gate doping concentration and poly-Si/SiO/sub 2/ interface stress relaxation

✍ Wristers, D.; Wang, H.H.; Wolf, I.D.; Han, L.K.; Kwong, D.L.; Fulford, J. 📂 Article 📅 1996 🏛 IEEE ⚖ 754 KB

[IEEE Proceedings of International Relia

[IEEE Proceedings of International Reliability Physics Symposium - Dallas, TX, USA (1996.04.30-1996.05.2)] Proceedings of International Reliability Physics Symposium RELPHY-96 - Investigation of charging damage induced V/sub t/ mismatch for submicron mixed-signal technology

✍ Zhao, J.; Chen, H.S.; Teng, C.S. 📂 Article 📅 1996 🏛 IEEE ⚖ 417 KB