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[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Microwave frequency measurements and modeling of MOSFETs on low resistivity silicon substrates

✍ Scribed by Biber, C.; Morf, T.; Benedickter, H.; Lott, U.; Bachtold, W.

Book ID: 121879841
Publisher: IEEE
Year: 1996
Weight: 535 KB
Category: Article
ISBN-13: 9780780327832
DOI: 10.1109/ICMTS.1996.535648

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