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[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - CMOS IC transient radiation effects investigations, model verification and parameter extraction with the test structures laser simulation tests

✍ Scribed by Nikiforov, A.Y.; Chumakov, V.I.; Skorobogatov, O.

Book ID: 120926380
Publisher: IEEE
Year: 1996
Weight: 694 KB
Category: Article
ISBN-13: 9780780327832
DOI: 10.1109/ICMTS.1996.535656

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