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[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Matching of MOS transistors with different layout styles

✍ Scribed by Bastos, J.; Steyaert, M.; Graindourze, B.; Sansen, W.

Book ID: 115459911
Publisher: IEEE
Year: 1996
Weight: 290 KB
Volume: 0
Category: Article
ISBN-13: 9780780327832
DOI: 10.1109/icmts.1996.535615

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