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[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Numerical analysis of the effect of geometry on the performance of the Greek cross structure

✍ Scribed by Newsam, M.I.; Walton, A.J.; Fallon, M.

Book ID: 120622442
Publisher: IEEE
Year: 1996
Weight: 886 KB
Category: Article
ISBN-13: 9780780327832
DOI: 10.1109/ICMTS.1996.535655

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