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[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - Mismatch characterization of small size MOS transistors

✍ Scribed by Bastos, J.; Steyaert, M.; Roovers, R.; Kinget, P.; Sansen, W.; Graindourze, B.; Pergoot, A.; Janssens, E.

Book ID: 121389586
Publisher: IEEE
Year: 1995
Weight: 677 KB
Category: Article
ISBN-13: 9780780320659
DOI: 10.1109/ICMTS.1995.513986

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