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[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - Gate antenna structures for monitoring oxide quality and reliability

✍ Scribed by Nariani, S.R.; Gabriel, C.T.; Pramanik, D.; Ng, K.

Book ID: 111890263
Publisher: IEEE
Year: 1995
Weight: 270 KB
Volume: 0
Category: Article
ISBN-13: 9780780320659
DOI: 10.1109/icmts.1995.513952

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