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[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - Characterization and modeling of MOS mismatch in analog CMOS technology

✍ Scribed by Shyh-Chyi Wong, ; Jyh-Kang Ting, ; Shun-Liang Hsu,

Book ID: 121329241
Publisher: IEEE
Year: 1995
Weight: 467 KB
Category: Article
ISBN-13: 9780780320659
DOI: 10.1109/ICMTS.1995.513967

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