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[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - United methodology for pre-determination of bipolar transistor SPICE model parameters for low, middle and high power ICs

✍ Scribed by Petrosjanc, K.O.; Kharitonov, I.A.; Rjabov, N.I.

Book ID: 115534255
Publisher: IEEE
Year: 1995
Weight: 452 KB
Volume: 0
Category: Article
ISBN-13: 9780780320659
DOI: 10.1109/icmts.1995.513975

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