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[IEEE 2004 International Conference on Microelectronic Test Structures - Awaji Yumebutai, Japan (22-25 March 2004)] Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) - Test structures and analysis techniques for estimation of the impact of layout on MOSFET performance and variability

✍ Scribed by Saxena, S.; Minehane, S.; Cheng, J.; Sengupta, M.; Hess, C.; Quarantelli, M.; Kramer, G.M.; Redford, M.

Book ID: 118166233
Publisher: IEEE
Year: 2004
Weight: 280 KB
Volume: 0
Category: Article
ISBN-13: 9780780382626
DOI: 10.1109/icmts.2004.1309492

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