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[IEEE 2004 International Conference on Microelectronic Test Structures - Awaji Yumebutai, Japan (22-25 March 2004)] Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) - Merits and limitations of circular TLM structures for contact resistance determination for novel III-V HBTs

✍ Scribed by Klootwijk, J.H.; Timmering, C.E.

Book ID: 120005749
Publisher: IEEE
Year: 2004
Weight: 376 KB
Category: Article
ISBN-13: 9780780382626
DOI: 10.1109/ICMTS.2004.1309489

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