𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2004 International Conference on Microelectronic Test Structures - Awaji Yumebutai, Japan (22-25 March 2004)] Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) - A new test circuit for the matching characterization of npn bipolar transistors

✍ Scribed by Einfeld, J.; Schaper, U.; Kollmer, U.; Nelle, P.; Englisch, J.; Stecher, M.

Book ID: 120005748
Publisher: IEEE
Year: 2004
Weight: 336 KB
Category: Article
ISBN-13: 9780780382626
DOI: 10.1109/ICMTS.2004.1309465

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2004 International Conference on M

[IEEE 2004 International Conference on Microelectronic Test Structures - Awaji Yumebutai, Japan (22-25 March 2004)] Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) - A novel RFCMOS process monitoring test structure

✍ Sia, C.B.; Ong, B.H.; Lim, K.M.; Yeo, K.S.; Do, M.A.; Ma, J.G.; Alam, T. 📂 Article 📅 2004 🏛 IEEE ⚖ 446 KB

[IEEE 2004 International Conference on M

[IEEE 2004 International Conference on Microelectronic Test Structures - Awaji Yumebutai, Japan (22-25 March 2004)] Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) - Varactor modeling methodology for simulation of the VCO tuning sensitivity

✍ Siprak, D.; Roithrneier, A. 📂 Article 📅 2004 🏛 IEEE ⚖ 276 KB

[IEEE 2004 International Conference on M

[IEEE 2004 International Conference on Microelectronic Test Structures - Awaji Yumebutai, Japan (22-25 March 2004)] Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) - Test structures and analysis techniques for estimation of the impact of layout on MOSFET performance and variability

✍ Saxena, S.; Minehane, S.; Cheng, J.; Sengupta, M.; Hess, C.; Quarantelli, M.; Kr 📂 Article 📅 2004 🏛 IEEE ⚖ 280 KB

[IEEE 2004 International Conference on M

[IEEE 2004 International Conference on Microelectronic Test Structures - Awaji Yumebutai, Japan (22-25 March 2004)] Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) - Merits and limitations of circular TLM structures for contact resistance determination for novel III-V HBTs

✍ Klootwijk, J.H.; Timmering, C.E. 📂 Article 📅 2004 🏛 IEEE ⚖ 376 KB

[IEEE International Conference on Microe

[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - Mismatch characterization of small size MOS transistors

✍ Bastos, J.; Steyaert, M.; Roovers, R.; Kinget, P.; Sansen, W.; Graindourze, B.; 📂 Article 📅 1995 🏛 IEEE ⚖ 677 KB

[IEEE ICMTS 1998. International Conferen

[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - A high density integrated test matrix of MOS transistors for matching study

✍ Portmann, L.; Lallement, C.; Krummenacher, F. 📂 Article 📅 1998 🏛 IEEE ⚖ 935 KB