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[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - A high density integrated test matrix of MOS transistors for matching study

✍ Scribed by Portmann, L.; Lallement, C.; Krummenacher, F.

Book ID: 121389587
Publisher: IEEE
Year: 1998
Weight: 935 KB
Category: Article
ISBN-13: 9780780343481
DOI: 10.1109/ICMTS.1998.688028

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