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[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - On the impact of spatial parametric variations on MOS transistor mismatch

✍ Scribed by Elzinga, H.

Book ID: 121390302
Publisher: IEEE
Year: 1996
Weight: 610 KB
Category: Article
ISBN-13: 9780780327832
DOI: 10.1109/ICMTS.1996.535641

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