𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - An efficient parameter extraction methodology for the EKV MOST model

✍ Scribed by Bucher, M.; Lallement, C.; Enz, C.C.

Book ID: 121692898
Publisher: IEEE
Year: 1996
Weight: 593 KB
Category: Article
ISBN-13: 9780780327832
DOI: 10.1109/icmts.1996.535636

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE International Conference on Microe

[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Matching of MOS transistors with different layout styles

✍ Bastos, J.; Steyaert, M.; Graindourze, B.; Sansen, W. 📂 Article 📅 1996 🏛 IEEE ⚖ 290 KB

[IEEE International Conference on Microe

[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - CMOS IC transient radiation effects investigations, model verification and parameter extraction with the test structures laser simulation tests

✍ Nikiforov, A.Y.; Chumakov, V.I.; Skorobogatov, O. 📂 Article 📅 1996 🏛 IEEE ⚖ 694 KB

[IEEE International Conference on Microe

[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - On the impact of spatial parametric variations on MOS transistor mismatch

✍ Elzinga, H. 📂 Article 📅 1996 🏛 IEEE ⚖ 610 KB

[IEEE International Conference on Microe

[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Microwave frequency measurements and modeling of MOSFETs on low resistivity silicon substrates

✍ Biber, C.; Morf, T.; Benedickter, H.; Lott, U.; Bachtold, W. 📂 Article 📅 1996 🏛 IEEE ⚖ 535 KB

[IEEE International Conference on Microe

[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Numerical analysis of the effect of geometry on the performance of the Greek cross structure

✍ Newsam, M.I.; Walton, A.J.; Fallon, M. 📂 Article 📅 1996 🏛 IEEE ⚖ 886 KB

[IEEE 2011 International Conference on M

[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Improved parameter extraction procedures for the R3 model

✍ McAndrew, Colin C.; Bettinger, Tamara 📂 Article 📅 2011 🏛 IEEE ⚖ 333 KB