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[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Improved parameter extraction procedures for the R3 model

✍ Scribed by McAndrew, Colin C.; Bettinger, Tamara

Book ID: 118008192
Publisher: IEEE
Year: 2011
Weight: 333 KB
Volume: 0
Category: Article
ISBN: 1424485266
DOI: 10.1109/icmts.2011.5976858

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