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[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Contact resistance measurement structures for high frequencies

✍ Scribed by Roy, Deepu; Pijper, Ralf M. T.; Tiemeijer, Luuk F.; Wolters, Rob A. M.

Book ID: 115502995
Publisher: IEEE
Year: 2011
Weight: 471 KB
Volume: 0
Category: Article
ISBN: 1424485266
DOI: 10.1109/icmts.2011.5976859

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