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[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - A versatile defectivity monitor designed for efficient test and failure analysis

✍ Scribed by Lauderdale, Matt; Smith, Brad

Book ID: 118008190
Publisher: IEEE
Year: 2011
Weight: 284 KB
Volume: 0
Category: Article
ISBN: 1424485266
DOI: 10.1109/icmts.2011.5976855

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