𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Spintronic materials and devices: past, present and future!

✍ Scribed by Parkin, S.S.P.

Book ID: 118277114
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 294 KB
Volume: 0
Category: Article
ISBN-13: 9780780386846
DOI: 10.1109/iedm.2004.1419328

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - SON (silicon-on-nothing) technological CMOS platform: highly performant devices and SRAM cells

✍ Monfray, S.; Chanemougame, D.; Borel, S.; Talbot, A.; Loverd, F.; Planes, N.; De 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 328 KB

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Comprehensive study of soft errors in advanced CMOS circuits with 90/130 nm technology

✍ Y. Tosaka, H. Ehara 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 246 KB

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Mobility improvement for 45nm node by combination of optimized stress control and channel orientation design

✍ Komoda, T.; Oishi, A.; Sanuki, T.; Kasai, K.; Yoshimura, H.; Ohno, K.; lwai, M.; 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 255 KB

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Highly scalable non-volatile resistive memory using simple binary oxide driven by asymmetric unipolar voltage pulses

✍ Baek, I.G.; Lee, M.S.; Sco, S.; Lee, M.J.; Seo, D.H.; Suh, D.-S.; Park, J.C.; Pa 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 257 KB

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Experimental study of biaxial and uniaxial strain effects on carrier mobility in bulk and ultrathin-body SOI MOSFETs

✍ Uchida, K.; Zednik, R.; Ching-Huang Lu, ; Jagannathan, H.; McVittie, J.; McIntyr 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 294 KB

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Silicon on thin BOX: a new paradigm of the CMOSFET for low-power and high-performance application featuring wide-range back-bias control

✍ Tsuchiya, R.; Horiuchi, M.; Kimura, S.; Yamaoka, M.; Kawahara, T.; Maegawa, S.; 📂 Article 📅 2004 🏛 IEEE ⚖ 333 KB