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[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Silicon on thin BOX: a new paradigm of the CMOSFET for low-power and high-performance application featuring wide-range back-bias control

✍ Scribed by Tsuchiya, R.; Horiuchi, M.; Kimura, S.; Yamaoka, M.; Kawahara, T.; Maegawa, S.; Ipposhi, T.; Ohji, Y.; Matsuoka, H.

No coin nor oath required. For personal study only.

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