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[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - SON (silicon-on-nothing) technological CMOS platform: highly performant devices and SRAM cells

✍ Scribed by Monfray, S.; Chanemougame, D.; Borel, S.; Talbot, A.; Loverd, F.; Planes, N.; Delille, D.; Dutartre, D.; Palla, R.; Morand, Y.; Descombes, S.; Samson, M.-P.; Vulliet, N.; Sparks, T.; Vandooren, A.; Skotnicki, T.

Book ID: 118154528
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 328 KB
Volume: 0
Category: Article
ISBN-13: 9780780386846
DOI: 10.1109/iedm.2004.1419246

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