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[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Comprehensive study of soft errors in advanced CMOS circuits with 90/130 nm technology

✍ Scribed by Y. Tosaka, H. Ehara

Book ID: 111909464
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 246 KB
Volume: 0
Category: Article
ISBN-13: 9780780386846
DOI: 10.1109/iedm.2004.1419339

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